Physics-based Reliability Assessment of Embedded Passives
Submitted by Caspar_admin on Fri, 01/03/2014 - 21:33Citation:
Damani, M., Pucha, R.V., Bhattacharya, S., Tummala, R., and Sitaraman, S.K., "Physics-based Reliability Assessment of Embedded Passives," 54th Electronic Components and Technology Conference, IEEE-CPMT and EIA, Las Vegas, NV, June 2004, pp. 2027-2031