A Monobit Built-In Test and Diagnostic System for Flexible Electronic Interconnect

Citation: 
Lei, J. Y., Moon, T., Chow, J., Sitaraman, S. K., and Chatterjee, A., “A Monobit Built-In Test and Diagnostic System for Flexible Electronic Interconnect,” 2018 IEEE 27th Asian Test Symposium (ATS) Oct. 2018, pp. 191-196.