Examination of Consistent Application of Interfacial Fracture Criteria, Microelectronics Reliability

Citation: 
Samet, D., Rambhatla, V. N. N. T., and Sitaraman, S. K., “Examination of Consistent Application of Interfacial Fracture Criteria, Microelectronics Reliability,” Transactions of the ASME – Journal of Electronic Packaging, https://doi.org/10.1115/1.4045706, Dec. 2019. 142(2), 2020.