Field-Use Conditions Vs. Thermal Cycles – A Physics-Based Mapping Study

Citation: 
Tunga, K., Pyland, J., Pucha, R. V., and Sitaraman, S.K. “Field-Use Conditions Vs. Thermal Cycles – A Physics-Based Mapping Study,” 53nd Electronic Components and Technology Conference, IEEE-CPMT and EIA, New Orleans, LA, May 2003, pp. 182-188.