Single-Substrate Decohesion Test for Interfacial Fracture Toughness Measurement

Citation: 
Modi, M. and Sitaraman, S. K., “Single-Substrate Decohesion Test for Interfacial Fracture Toughness Measurement,” EPTC 2003, 5th Electronics Packaging Technology Conference, Proceedings EPTC 2003, 5th Electronics Packaging Technology Conference, IEEE-CPMT and IMAPS, Dec. 10-12, 2003, Singapore, pp. 456-461.