Single-Strip Decohesion Test to Characterize Nano-Scale Thin Film Delamination

Citation: 
Zheng, J. and Sitaraman, S., “Single-Strip Decohesion Test to Characterize Nano-Scale Thin Film Delamination,” InterPACK ’05, The ASME/Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems, July 2005, San Francisco, CA, USA, IPACK2005-73495.