System-Level Reliability Assessment of Mixed-Signal Convergent Microsystems

Citation: 
Pucha, R. V., Hegde, S., Damani, M., Tunga, K., Perkins, A., Mahalingam, S., Lo, G., Klein, K., Ahmad, J., and Sitaraman, S. K., "System-Level Reliability Assessment of Mixed-Signal Convergent Microsystems," IEEE Transactions on Advanced Packaging, Vol. 27. No. 2, May 2004, pp 438-452.