Fixtureless non-contact fatigue testing for nano-scale thin films using electromagnetism method

Provisional Patent, Zheng, J., and Sitaraman, S.K., “Fixtureless non-contact fatigue testing for nano-scale thin films using electromagnetism method,” July 2005, Based on Invention Disclosure GTRC ID# 3561.

type: 
Provisional Patent
Year: 
2 005