Sathyanarayanan Raghavan PhD Defense

EXPERIMENTAL AND THEORETICAL STUDY OF ON-CHIP BACK-END-OF-LINE (BEOL) STACK FRACTURE DURING FLIP-CHIP REFLOW ASSEMBLY

Monday, October 20, 2014, 9:00 a.m.

MARC Building, 201

Link:http://www2.me.gatech.edu/theses/summary.asp?db=3&LASTNAME=Raghavan&FIRSTNAME=Sathyanarayanan