Intel Best Student Paper at 62nd ECTC

Sathyanarayanan Raghavan

Interlayer Dielectric Cracking in Back End of Line (BEOL) Stack by Sathyanarayanan Raghavan – Georgia Institute of Technology; Ilko Schmadlak – Freescale Semiconductor; and Suresh K. Sitaraman

type: 
Student Award
Year: 
2 012